The Ethernet Alliance (News - Alert) has teamed with Optoelectronics Industry Development Association (OIDA) on a collaborative workshop to discuss next steps in the ongoing evolution of 100GbE.
Experts and key Ethernet and optics stakeholders will come together for this workshop on 100 Gigabit Ethernet (100GbE) per lambda interconnects targeting data center networks.
This workshop is scheduled for June 12 – 13, 2014, at the San Jose Convention Center, San Jose, California.
Attendees of the “100GbE per Lambda for Data Center” workshop will be able to identify and explore the challenges and benefits of commercializing single-lambda 100GbE optical communications for data center applications.
“OIDA is very pleased to be joining the Ethernet Alliance in the pursuit of single-lambda 100GbE, and we are looking forward to an exciting, productive event,” said Tom Hausken, senior industry advisor, OIDA, a division of The Optical Society (OSA).
Many speakers from OIDA and Ethernet Alliance member companies will participate in this event including Dell Inc., Broadcom (News - Alert) Corporation and Brocade Communications Systems, Inc.
These speakers will cover a wide range of topics such as how to spur needed industry investment in single-lambda technologies and the drivers behind the push for 100GbE single wavelength technologies.
Designed to help lay groundwork for future development, the workshop will provide attendees with a better understanding of the opportunities, challenges, and benefits of single-lambda 100GbE.
“Through events like this workshop, we can begin developing those long-term tools that will carry us through the next phase of 100GbE’s evolution, and all the way up to terabit Ethernet,” said John D’Ambrosia, chairman, Ethernet Alliance, and chief Ethernet evangelist, Dell (News - Alert).
The Ethernet Alliance was in the news earlier this year for launching a Power over Ethernet (PoE) Subcommittee to support the standardization activities and other efforts addressing changing landscape of the Ethernet ecosystem.
Edited by Maurice Nagle