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Nikon Instruments Launches New High-Content Microscope System

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December 17, 2012

Nikon Instruments Launches New High-Content Microscope System

By Rahul Arora
TMCnet Contributor

Nikon Instruments Inc., a company engaged in the development and manufacture of optical and digital imaging technology for biomedical applications, recently introduced a new High-Content (HC) microscope system, now available.

The High-Content microscope system provides a dedicated interface for high-content acquisition and analysis routines by pairing the Eclipse Ti inverted microscope with NIS-Elements HC Software. It features high-speed piezo-based autofocusing, plate handling, solid state light source and fast wavelength switching, as well as the full range of NIS-Elements camera model support.


Nikon's HC Analysis System, built on the NIS-Elements platform, streamlines high-speed automated well plate acquisition, data review, analysis and management of multiple well plate job runs. NIS-Elements HC Analysis System has easy step-through plate configuration paired with interchangeable hardware components for plate handling, autofocusing, quick filter switching and selectable detector choices.

The real-time viewing of data acquisition and analysis progress is displayed for instant inspection. Multiple analysis assays can run simultaneously during the imaging phase or post-acquisition on offline stations.

Plate Heat Maps, images, generated binary masks, assay results, sample labeling and other metadata are centralized for quick filtering, gating and drill down to cellular detail.

"Nikon is excited to offer a new avenue for researchers to add high content applications to their imaging without giving up the power and flexibility of their Ti 'Perfect Focus' workhorse," said Stephen Ross (News - Alert), Ph.D., general manager of Product and Marketing at Nikon Instruments, Inc. "There's a lot to be said for the confidence and ease of a familiar instrument when you're scaling up the imaging capability within the same system."

In October, Nikon Instruments announced the release of the third-generation Perfect Focus System. This new generation, consisting of two new models, debuted at Neuroscience 2012. The new models of the TI-ND6-PFS-S Perfect Focus Unit have been optimized for UV-Visible imaging and Visible-IR Imaging for multi-photon microscopy.

Want to learn more about the latest in communications and technology? Then be sure to attend ITEXPO Miami 2013, Jan 29- Feb. 1 in Miami, Florida.  Stay in touch with everything happening at ITEXPO (News - Alert). Follow us on Twitter.




Edited by Braden Becker

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