Sematech Assigned Patent
(Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service
ALEXANDRIA, Va., Feb. 11 -- Sematech, Austin, Texas, has been assigned a patent (8,366,431) developed by Matt Malloy, Albany, N.Y., for a "partial die process for uniform etch loading of imprint wafers."
The abstract of the patent published by the U.S. Patent and Trademark Office states: "Methods, systems, and devices which result from, or facilitates, convenient processing of partial dies of a semiconductor chip in a lithography process are disclosed. Embodiments utilize an exposure through an imprint-style template which does not come in physical contact with the partial die. In one embodiment, a semiconductor process is disclosed which has at least one full die and at least one partial die. The semiconductor chip is fabricated, in part, by using an etching process which utilizes an imprint template configured to be exposed to the at least one full die when the imprint template is in contact with resist which has been dispensed onto the at least one full die. Further, at least one partial die of the semiconductor chip is configured to be exposed to the imprint template without the template contacting resist dispensed onto the at least one partial die."
The patent application was filed on April 13, 2010 (12/759,489). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=8,366,431&OS=8,366,431&RS=8,366,431
Written by Satyaban Rath; edited by Hemanta Panigrahi.
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