Essai Assigned Patent
(Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service
ALEXANDRIA, Va., Aug. 17 -- Essai, Fremont, Calif., has been assigned a patent (8,508,245) developed by four co-inventors for a "thermal control unit used to maintain the temperature of IC devices under test." The co-inventors are Nasser Barabi, Lafayette, Calif., Elena Nazarov, San Mateo, Calif., Joven R. Tienzo, Fremont, Calif., and Chee-Wah Ho, San Jose, Calif.
The abstract of the patent published by the U.S. Patent and Trademark Office states: "Thermal control units (TCU) for maintaining a set point temperature on an IC device under test (DUT) are provided. The units include a pedestal assembly comprising a heat-conductive pedestal, a fluid circulation block, a thermoelectric module (Peltier device) between the heat-conductive pedestal and the block for controlling heat flow between the pedestal and fluid circulation block, and a force distribution block for controllably distributing a z-axis force between different pushers of the TCU. Optionally, a swivelable temperature-control fluid inlet and outlet arms may be provided to reduce instability of the thermal control unit due to external forces exerted on the TCU such as by fluid lines attached to the fluid inlet and outlet arms. Also optionally, an integrated means for abating condensation on surfaces of the TCU during cold tests may be provided."
The patent application was filed on Nov. 30, 2010 (12/957,306). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8508245.PN.&OS=PN/8508245&RS=PN/8508245
Written by Sudarshan Harpal; edited by Jaya Anand.
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