Teradyne Assigned Patent
(Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service
ALEXANDRIA, Va., Sept. 5 -- Teradyne, North Reading, Mass., has been assigned a patent (8,527,231) developed by Lawrence B. Luce, Sun Lakes, Ariz., for a "high throughput semiconductor device testing."
The abstract of the patent published by the U.S. Patent and Trademark Office states: "A test system that provides an output signal for analysis without requiring the test hardware to be idle during a settling interval. The test system includes a preprocessor that identifies the near-DC drift that occurs in the output signal and then adjusts the output signal to remove the near-DC drift. A set of values representing the near-DC drift at each of multiple times during the acquisition of a signal for analysis may be computed and used to model a settling profile of the signal by fitting a curve to the set of values. The model of the settling profile may then be subtracted from samples representing the output signal to provide an adjusted signal for further analysis."
The patent application was filed on Sept. 15, 2010 (12/882,695). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8,527,231.PN.&OS=PN/8,527,231&RS=PN/8,527,231
Written by Kusum Sangma; edited by Anand Kumar.
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