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TMCNet:  Scanning electron microscopes [TendersInfo (India)]

[December 13, 2013]

Scanning electron microscopes [TendersInfo (India)]

(TendersInfo (India) Via Acquire Media NewsEdge) Contract award: sem with fib - bm 046/230431/cl-ols Combined scanning electron microscope with Focussed Ion Beam. It is a combined scanning electron microscope (SEM) with Focussed Ion Beam (FIB) to be procured. This is hereinafter referred to as SEM / FIB apparatus. It is a field emission scanning electron microscope, which in addition to the in-situ preparation possesses a focused ion source with which material can be locally material by removal of a sample. The unit serves under SEM control individual cross sections, series of cross-sections or thin TEM lamella to prepare a sample that can be analyzed by SEM, EDX, STEM and other procedures followed in the same device. In addition, surfaces can be structured by cost of materials or removal of material on the nanometer scale. Date of contract award decision: 28.10.2013 Contractor name : CARL ZEISS MICROSCOPY GMBH Contractor address : Carl-Zeiss-Straße 56 73447 Oberkochen GERMANY Agency : Fraunhofer Gesellschaft e. V. Hansastraße 27c For the attention of: Carla Lönz 80686 München GERMANY Telephone: +49 8912053229 Fax: +49 8912057547 E-mail: Internet address(es): General address of the contracting authority: country :Germany (c) 2013 Euclid Infotech Pvt. Ltd. Provided by, an company

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