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Metrologic Instruments Assigned Patent for Image Capture and Processing System Supporting Multi-tier Modular Software Architecture(Targeted News Service Via Acquire Media NewsEdge) By Targeted News Service ALEXANDRIA, Va., Oct. 6 -- Metrologic Instruments, Blackwood, New Jersey, has been assigned a patent (8,844,822) developed by Anatoly Kotlarsky, Holland, Pennsylvania, and Xiaoxun Zhu, Marlton, New Jersey, for an "image capture and processing system supporting a multi-tier modular software architecture." The patent application was filed on Feb. 4, 2013 (13/758,461). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8,844,822.PN.&OS=PN/8,844,822&RS=PN/8,844,822 Written by Kusum Sangma; edited by Jaya Anand. KS1006JA1006-1067408 (c) 2014 Targeted News Service |